ARM

 

JEOL JEM ARM 200F

The ARM 200F provides a corrector for the spherical aberration (Cs) of the condenser system. The resulting sharp probe enables for imaging (HRSTEM) and chemical analysis (EELS, EDS) of grain- and phase boundaries on the atomic scale.

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Implementation: 2011
Resolution: 0.8 Å (STEM)
1.9 Å (TEM, 200kV)
Instrumentation:
  • field emission cathode(Schottky)
  • Cs corrector (condenser system)
  • EELS detector (Gatan Enfina)
  • EDX detector (JED 2300T, JEOL)
  • DF, HAADF, BF, ABF
  • stabilized Be double tilt holder
  • single tilt holder
  • field compensation