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Transmission Electron Microscopes (TEM)

 
  • JEOL JEM ARM 200F
  • JEOL JEM 2100F
  • FEI CM 20 ST
  • FEI CM12

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Scanning Electron Microscopes (SEM)

 
  • JEOL JSM 7600F

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Focused Ion Beam (FIB)

 
  • JEOL JIB 4600F

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Preparation

 
  • MultiPrep System (ALLIED High Tech Products)
  • Precision Ion Polishing System (GATAN)

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