Focused Ion Beam (FIB) JEOL JIB 7600F
The JIB 4600F is a dual beam FIB, therefore, allowing for a parallel observation and preparation of the specimen. Equipped with a Kleindiek micromanipulator, EDS, EBSD, and an electron lithography system, it is a multi purpose machine, providing TEM sample preparation, but also specimen manipulation and characterization.
1.2 nm (30 kV, REM)|
5 nm (30 kV, SIM)