Details and manufacturer
Scanning electron microscope JEOL JSM-7600F und Focused Ion-Beam (FIB) microscope JIB 4600F
Contact
EMC_DA_Start – Geomaterialwissenschaft – TU Darmstadt (tu-darmstadt.de)
Institute of Applied Geosciences
Scanning electron microscope JEOL JSM-7600F und Focused Ion-Beam (FIB) microscope JIB 4600F
EMC_DA_Start – Geomaterialwissenschaft – TU Darmstadt (tu-darmstadt.de)